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Annealing-induced evolution of structure and in-plane magnetic anisotropy in sputtered FeGa alloy films

Aug 2026 · Journal of Physics, Conference Series · Vol 3284, pp. 012060 · 0 citations · 18 references
Physics

Abstract

In this work, we investigate the evolution of in-plane magnetic anisotropy in FeGa thin films as a function of post-deposition annealing temperature. FeGa films were deposited on GaN/Al2O3(0001) substrates by RF magnetron sputtering and subsequently annealed to tailor their structural ordering and composition. Room-temperature magnetic measurements reveal a strong annealing-dependent modification of anisotropy symmetry and strength, with moderate annealing enhancing directional response and higher temperatures leading to well-defined magnetocrystalline anisotropy. Structural analysis indicates a transition from predominantly L12 ordering in as-deposited and low-temperature annealed films to the emergence of the D03 phase at higher annealing temperatures, accompanied by lattice parameter variation and compositional redistribution. These results establish a direct correlation between annealing-induced phase transformation and magnetic anisotropy, providing insight into the controlled tuning of FeGa thin films for magnetostrictive and spintronic applications.

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