Aug 2026· Signal, Image and Video Processing· Vol 20· 0 citations· 38 references
TL;DR
The proposed Multi-Scale Feature Fusion with Mixed Supervision Network (MSFFMS-Net), a novel architecture that enhances defect detection accuracy while minimizing annotation effort, achieves competitive performance under mixed supervision.
Automated bridge surface defect detection is essential for improving the efficiency and objectivity of infrastructure inspection under complex field imaging conditions. This study proposes a Multi-Scale Detection Transformer (MS-DETR), an RT-DETR-based detector that integrates HeteroFusionNet, a multi-objective scale-a...
Bao-Yong Zhang, Xue-Qiu Wang, Zhi-Peng Liu et al.· Digital· 0 citations
Steel surface defect detection is vital for guaranteeing product quality in contemporary manufacturing. However, traditional steel surface defect detection algorithms often face challenges due to insufficient resilience in feature extraction under complex backgrounds. To address this, we present a framework for def...
Hong-Kai Zhang, Song Xue, Yuan Yao et al.· Scientific Reports· 0 citations
In industrial quality control, deep learning-based weld defect detection has shown promise but is often hindered by the need for extensive labeled datasets. This study introduces a novel graph neural network (GNN) approach for few-shot classification of weld defect images, aimed at mitigating data dependence and enabli...
Zhong-Yan Zhang, Wei-Hao Shen, Hai-Peng Cui et al.· Welding Journal· 0 citations
A prototype-enhanced YOLO-based defect detection model for few-shot industrial applications that outperforms mainstream defect detection models, validating its effectiveness in few-shot industrial defect detection tasks.
Zhi-Qiang Lu, Wei-Yan Liu, Li-Peng Pan et al.· International Conference on...· 0 citations
CMNet, a novel hybrid CNN–Mamba detection network with a dual-branch, heterogeneous feature-extraction architecture, is proposed, which significantly outperforms state-of-the-art methods on fabric defect detection datasets.
Yang Chen, Zhou-Feng Liu, Kai-Hua Wang et al.· Electronics· 0 citations
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