Nuria Jiménez-Arévalo

Modular and Cost-effective Scanning Photocurrent Microscopy System for Sub-micron characterization of 2D optoelectronic devices

Scanning photocurrent microscopy (SPCM) is a powerful technique for probing local optoelectronic phenomena in 2D semiconducting devices. However, commercial setups remain costly, complex and often lack flexibility and adaptability. In this work, we present a home-built SPCM platform built around the retrofitting of a c...