Investigation on Hot-Carrier Injection Mechanisms and Reliability Design-Based Strategies in Cryogenically Operated CMOS ROICs for Infrared Focal Plane Arrays
Cryogenic operation of CMOS read-out integrated circuits (ROICs) is essential for high-performance infrared focal plane arrays but significantly affects carrier transport and device reliability. This work investigates hot-carrier injection (HCI) mechanisms in 180 nm NMOS transistors operating from room temperature down...