Near-optimal quantum metrology with few-qubit measurements

Abstract

Quantum metrology, which addresses parameter estimation in quantum systems, has broad applications across science and technology. Conventional metrology protocols for multi-qubit states in the multi-parameter regime typically require highly complex quantum measurements, leading to substantial quantum-resource costs. In this work, we introduce a family of metrology protocols that use only few-qubit measurements, thereby significantly reducing the required resources. For arbitrary pure states, one of our protocols approaches the quantum Cram\'{e}r-Rao bound up to an overhead in sample complexity that scales linearly with the number of qubits, irrespective of the number of parameters to be estimated. For typical Haar-random states, this overhead can be reduced to a constant. Our results build on recent advances in quantum state certification protocols with few-qubit measurements: we establish a universal connection between certification and metrology in which the precision of the certification protocol determines the metrological overhead. We also illustrate our approach through an example of Hamiltonian estimation from ground states.