Conference

DfT-Assisted Testing of Resistive Short Defects in SRAM-Based In-Memory Computing Architectures

D. Lampridis Yiorgos Tsiatouhas M. Michael T. Theocharides

Oct 2026 · IEEE/IFIP International Conference on Very Large Scale Integration of System-on-Chip · pp. 1-5 · 0 citations · 21 references

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