PRINCIPLES OF SYNTHESIS AND ANALYSIS OF MEASUREMENT SYSTEMS INVARIANT TO THE INFLUENCE OF A SET OF UNCERTAIN DESTABILIZING FACTORS

Abstract

Background. During operation, the parameters of measuring systems (MS) change under the influence of various destabilizing factors (DF), including time. Deviation of measuring system parameters from nominal values leads to significant errors in estimating an unknown input signal. The aim of this work is to formulate principles for the synthesis and analysis of MSs that are invariant to the influence of a set of uncertain DFs, the frequency spectrum of which lies within the spectrum of the useful signal. This allows for a unified methodological approach to the creation of high-precision MSs for static and dynamic measurement modes in complex interference environments. Materials and methods. The following should be considered as the main principles for the synthesis and analysis of dynamic integrated circuits (DIs) with the aim of minimizing their additional systematic errors: 1) multichannel nature, 2) asymmetry and physical feasibility of additional measuring channels, 3) informativeness of input signals, 4) consideration of the incorrectness of the procedures for identifying parameters and reconstructing the input signals of dynamic integrated circuits, 5) consideration of a priori information regarding the list of DFs and the possibilities of their simulation during preliminary metrological testing. Results and conclusions. Within the framework of the formulated principles, two directions for the synthesis of structurally redundant integrated circuits should be distinguished, depending on the knowledge of the list of DFs and the possibilities of their simulation during preliminary metrological testing. These, in turn, lead to the need to develop active (preliminary) methods for identifying IC parameters during metrological testing or passive (current) methods for identifying IC parameters at the place of their operation with unknown input signals.