Improved E-Value Thresholds with Applications to Multiple and Sequential Testing

Abstract

E-values provide a flexible framework for statistical inference, but the universal threshold $1/\alpha$ can be conservative when the null distribution has additional structure. We study how structural restrictions limit the worst-case concentration underlying Markov's inequality, using a nondecreasing density model to constrain tail allocation and an $L$-Lipschitz density model to control local concentration. The nondecreasing model gives the minimax rejection threshold, and the Lipschitz condition yields a sharper closed-form threshold with an $O(L^{-1/2})$ relative improvement over $1/\alpha$. We further show that this threshold is asymptotically sharp as $\alpha\to0$, in the sense that no uniformly valid threshold can improve on it by a fixed positive $L$-dependent amount. We then incorporate the Lipschitz calibration into multiple testing procedures with FDR control and use the same structural information to construct calibrated conditional e-values for anytime-valid sequential inference. Numerical experiments illustrate the resulting gains in discoveries and the trade-offs of the sequential procedures.