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Conference

A Hybrid Quantum-Classical Approach to Mitigating Detection Risks in Deep Learning Models for Intelligent Manufacturing Simulations

Narasimha Swamy Lavudiya Bandaru Bhargav Santosh S.Kalaiselvan M. Naik JV Rama Kumar M.Srikanth
Aug 2026 · International Conference Electronic Systems, Signal Processing and Computing Technologies [ICESC-] · pp. 1704-1711 · 0 citations · 16 references
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