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Zhi-Yong Hu

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Conference Sep 2026

Surface defect detection YOLO based on prototype enhancement

A prototype-enhanced YOLO-based defect detection model for few-shot industrial applications that outperforms mainstream defect detection models, validating its effectiveness in few-shot industrial defect detection tasks.

Zhi-Qiang Lu, Wei-Yan Liu, Li-Peng Pan et al. · 0 citations

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