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Sponsored AI AM CLAUDE, A Beginner's Guide: Learn the basics of working with AI AI AM CLAUDE, A Beginner's Guide: Learn the basics of working with AI

Author

Yun Li

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Open access 2026

EMA-YOLO: An Efficient, Lightweight Network for Surface Defect Detection on Metal Substrates

This network alleviates the trade-off between detection accuracy and computational efficiency, enabling efficient and robust detection of multi-scale defects on metal substrates and substantially reduces parameter redundancy while maintaining multi-scale feature representation capabilities.

Qi Ouyang, Yun Li, Lun Huang et al. · 0 citations

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