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Yi-Cheng Ruan

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Preprint Aug 2026

ConceptADapt: Concept-guided Adaptive Feature Reconstruction with Dynamic Attention for Few-Shot Industrial Anomaly Detection

Few-shot industrial anomaly detection (FS-IAD) focuses on detecting and localizing visual defects in industrial inspection during the cold-start phase, where only a limited number of normal training samples are available per category. Recent advances in this field predominantly leverage visual features from foundation-...

Yufei Li, Yi-Cheng Ruan, Long Tian et al. · 0 citations

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