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Yao-Yin Chen

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Validation-uided Lightweight Attention for Small Chip Surface Defect Detection

These results show that targeted attention can improve moderate-overlap detection without the cost of an additional high-resolution head, but they also expose unresolved localization, source-domain, and false-accept limitations.

Yao-Yin Chen · 0 citations
Open access Aug 2026

Validation-Guided Lightweight Attention for Small Chip Surface Defect Detection

Small chip-surface defects are difficult to detect because they occupy few pixels and vary across acquisition domains. This study develops a compact YOLOv8n detector through controlled, validation-only ablations while preserving a held-out test set for later model development. The dataset comprised 3,511 real chip imag...

Yao-Yin Chen · 0 citations

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