Xiao-Sheng Si

Prognosis for Stochastic Degradation Devices: A Perspective of Lebesgue Sampling

Lebesgue sampling (LS) has emerged as an efficient paradigm for remaining useful life (RUL) prediction in stochastic degrading devices, because model updates are triggered only when critical degradation states are reached. However, its practical application is hindered by interval censoring under discrete monitoring, w...