Author

Simon Zhang

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Preprint Jul 2026

An End-to-End Differentiable Forward Model for High-Energy Diffraction Microscopy

High-Energy Diffraction Microscopy (HEDM) recovers crystallographic orientation, strain, and grain position from rotating-crystal X-ray diffraction patterns. Existing forward models in far-field (FF), near-field (NF), and point-focused (pf) HEDM are not differentiable, which forecloses gradient-based joint parameter re...

Hemant Sharma, Nina Andrejevic, Simon Zhang et al. · 1 citation