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Sponsored Artificial Intelligence: A Modern Approach, Global Edition Artificial Intelligence: A Modern Approach, Global Edition

Author

Satish Kumar

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Open access Sep 2026

Marker-assisted backcross breeding to develop wheat lines with stable yellow rust resistance without yield penalties

Wheat production faces severe yield threats globally and regionally in India from rust diseases caused by Puccinia species. Genetic resistance breeding is the most sustainable approach to mitigate these losses, but traditional phenotypic selection is often constrained by environmental fluctuations and rapid pathogen ev...

C. N. Mishra, Satish Kumar, Disha Kamboj et al. · 0 citations
Open access Jul 2026

QTL mapping for leaf rust resistance in bread wheat using PBW343/W8627 RIL population

Introduction Leaf rust, caused by Puccinia triticina, inflicts 10-50% yield losses in bread wheat, with newly emerging virulent pathotypes overcoming major Lr genes and rendering the cultivars susceptible. The identification of genetic loci conferring resistance to wheat leaf rust, coupled with the development of molec...

K. Vindhya, Renu Sharma, Satish Kumar et al. · 0 citations

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