Diffusion reconstruction with validity masks and measurement consistency for low-frame structured illumination microscopy
Reducing the raw-frame budget of structured illumination microscopy (SIM) lowers exposure burden but weakens orientation–phase diversity and increases sensitivity to noise and model mismatch. We present acquisition-aware physics-guided diffusion for SIM (APD-SIM), which combines a protocol-specific conditional diffusio...
Junli Wu, Song Dawei, Haoran Zhang et al.
· Optics & Laser Technology · 0 citations