Phat Ngoc Nguyen

Beyond Benchmark Scores: An Analysis of Resolution, Spatial Structure, Illumination, and Seed Sensitivity in Training-Free Industrial Anomaly Localization on MVTec AD 2

Training-free industrial anomaly localization avoids category-specific model training, but benchmark scores alone provide limited evidence about operational reliability. We present a fixed-protocol study on all eight MVTec AD 2 categories, comparing five variants across three families: three DINO configurations that jo...