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Author

Pavan Nukala

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Preprint Sep 2026

Operando Surface Probe Microscopy Reveals Electrochemical Origins of Reliability Variability in Hafnia Ferroelectrics

Device-to-device and sample-to-sample variability remains a major obstacle to the reliable implementation of hafnia-based ferroelectrics, even in nominally identical structures fabricated under similar processing conditions. This highlights the need for operando diagnostic probes that provide process-relevant feedback...

Anudeep Tullibilli, Kartick Biswas, S. Parate et al. · 0 citations

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