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Oguzhan Orkut Okudur

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Sep 2026

Vertical Compressive Stress in Fab-Integrated WS2 FETs: An In Situ Electrical and Nanoindentation-Based Study

Two-dimensional (2D) semiconductors are sensitive to mechanical stress due to their atomic thickness, weak van der Waals interfaces, and ultra-high sensitivity to the surrounding dielectric environment. While the effects of in-plane strain in transition-metal dichalcogenides (TMDs) have been extensively studied, the...

Kavita Vishwakarma, Mario Gonzalez, Q. Smets et al. · 0 citations

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