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Mallory M. Whalen

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Aug 2026

Metrology advancements for x-ray optics: Lynx and beyond

Next-generation X-ray telescopes require mirrors with surface height errors of a few nanometers. Traditional Fizeau interferometry is limited as measurements include surface errors on the surface under test (SUT) as well as the reference. Axial shift mapping (ASM) is a self-referencing interferometric method for near-c...

Mallory M. Whalen, Sarah N. T. Heine, Alan Garner et al. · 0 citations

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