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Sep 2026

High-Mobility MoS2 Transistors Enabled by In2P3S9 Functional Dielectric Engineering and Interfacial Dipole Modulation

Interfacial disorder, threshold-voltage instability, and mobility degradation present critical roadblocks for two-dimensional (2D) electronics. Conventional deposited high-κ oxides often introduce damage and defect states, whereas standard van der Waals (vdW) dielectrics function primarily as passive encapsulation la...

Shuo Liu, Yong-Si Liu, Xin-Yun Zhou et al. · 0 citations

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