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K. Naveen

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Review Aug 2026

Deep Learning Architectures for Fruit and Leaf Disease Detection: A Critical Analysis of Methods, Metrics, Challenges, and Future Research Directions

A complete assessment framework is presented that goes beyond traditional accuracy-based metrics and includes analysis related to confidence calibration and temporal consistency, as well as out-of-distribution robustness and adversarial stability, as well as out-of-distribution robustness and adversarial stability.

K. Naveen, D. Ajitha · 0 citations

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