Juan M. Ballesteros

Extended depth-of-field reflected-light microscopy with a low-cost robotic microscope and Fiji focus stacking: Workflow integration and baseline evaluation.

Optical reflected-light microscopy is widely used in mechanical and tribological testing laboratories, but its limited depth of field (DOF) restricts imaging of non-planar post-test surfaces when high-NA objectives are needed to resolve fine features. Here we present a low-cost robotic microscopy system (bill of materi...