Author

Juan Huang

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Open access Oct 2026

DAF-YOLO for detecting small defects with weak visual features on chip surfaces

The proposed DAF-YOLO model, an enhanced YOLO11 model for detecting small defects with weak visual features on chip surfaces, incorporates a dual-pooling channel-spatial attention module (DPCSA) to strengthen salient responses in small-defect regions and suppress interference from complex background textures.

Kai Wang, Ji-Nan Gu, Juan Huang · Engineering Research Express · 0 citations