Property-Based Testing of Wafer Handling Robots via Model-Based Planning and Fuzzing
This experience paper introduces a property-based testing approach for WHRs, finding 21 previously unknown bugs, including axis limit violations, entanglement issues, and missing interlock checks, and distilled a number of practical lessons learned.
Rui-Yang Xu, Jing-Jing Liang, Guo-Yue Zheng et al.
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