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Jeong-Cheol Lee

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Conference Jul 2026

Analytical Investigation of Current Imbalance in Metal Oxide Surge Arrester Bank Under DC Short Circuit Test-Bed

Electronic devices and power systems are vulnerable to transient overvoltage caused by lightning strikes, switching operations, and system faults. In DC circuit breaker applications, metal oxide surge arresters (MOSAs), composed of multiple metal oxide varistors (MOVs), play a critical role in absorbing fault energy an...

Jeong-Cheol Lee, I. Kwon, Y. Kwak et al. · 0 citations

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