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Jeong Bin Kim

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Open access Jul 2026

Intrinsically co-registered extended-depth-of-focus OCM and two-photon microscopy for label-free volumetric analysis of 3D cell models

Beam engineering effectively overcomes the resolution-depth of focus trade-off in high-NA optical coherence microscopy (OCM). Conventional OCM is limited by this constraint, hindering stable volumetric acquisition. To overcome this, we present an intrinsically registered imaging platform based on Bessel beam–enabled ex...

Hyunji Lee, Jeong Bin Kim, Ahreum Beak et al. · 0 citations

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