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Jaeung Lee

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#artificial intelligence May 2026

Measuring the Depth of LLM Unlearning via Activation Patching

The Unlearning Depth Score (UDS), a metric that quantifies the mechanistic depth of unlearning via activation patching, is introduced, confirming the causal approach as the most reliable for unlearning evaluation.

Jaeung Lee, Dohyun Kim, Jaemin Jo · arXiv.org · 1 citation