Intrinsically co-registered extended-depth-of-focus OCM and two-photon microscopy for label-free volumetric analysis of 3D cell models
Beam engineering effectively overcomes the resolution-depth of focus trade-off in high-NA optical coherence microscopy (OCM). Conventional OCM is limited by this constraint, hindering stable volumetric acquisition. To overcome this, we present an intrinsically registered imaging platform based on Bessel beam–enabled ex...