Open access
Sep 2026
AI-Assisted Materials Characterization: A Curriculum-Guided Multimodal Framework for Transmission Electron Microscopy
Scientific imaging techniques such as transmission electron microscopy (TEM) offer unparalleled nanoscale insights, but knowledge extraction remains severely limited by the scarcity of structured datasets and the extensive expertise required for interpretation. To overcome this bottleneck, we present an automation-dr...
Chong-Ren Tu, Hung-Wei Hsueh, Wei-Che Chang et al.
· ACS Measurement Science Au · 0 citations