SSRESF-OPT: A Sensitivity-Aware Framework for Single-Particle Radiation Effects Simulation and Optimization in SoC Platforms Using Machine Learning
The increasing scale of System-on-Chip (SoC) architectures exacerbates the reliability risks of single-particle radiation effects, rendering traditional exhaustive gate-level fault injection prohibitively slow. To address this, we propose SSRESF-OPT, an end-to-end simulation and optimization framework combining acceler...