KDSP-DEA-YOLO: Knowledge-Distillation-Guided Structured Pruning for Lightweight Industrial Surface Defect Detection
Small surface defects on industrial components are characterized by small scale, low contrast, weak texture, and strong background interference. To improve deployment efficiency while preserving detection accuracy, this study proposes KDSP-DEA-YOLO based on the DEA-YOLOv8n teacher model. A heterogeneous lightweight stu...