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Hao-Yu Chen

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Conference Oct 2026

Lightweight multi-class defect detection for intelligent substation inspection

Accurate and efficient defect detection is essential for intelligent substation inspection, yet existing lightweight detectors often struggle to balance detection accuracy, computational complexity, and deployment efficiency while covering diverse inspection targets. This paper proposes a lightweight multi-perception o...

Hao-Yu Chen, Xin Hu, Ya-Shu Chang · 0 citations

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