Preprint
Aug 2026
When More References Hurt: Contamination-Aware DINOv2 Memory Banks for Few-Shot Steel Defect Detection
Whether a few trusted normal images can safely recover useful normal patches from such references without defect masks is studied, and the proposed bank improves over naive expansion, with a mean gain of 0.0142 AUPRC.
Hannaneh Kalantary, J. Khoramdel
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