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Author

Hai-Tao Zhang

2 papers indexed here

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Conference Sep 2026

Research on SiC epitaxial layer thickness measurement based on infrared interferometry

Silicon carbide, as a core material of third-generation semiconductors, has epitaxial layer thickness precision that plays a decisive role in device performance. Infrared interferometry is a key technique for non-destructive measurement of this parameter. Based on the principles of geometric optics and wave optics, thi...

Shuo Zhang, Hai-Yun Zhang, Hai-Tao Zhang et al. · 0 citations
Open access Sep 2026

Fabrication of High-Performance Flexible Perovskite Solar Cells Based on Composite Modification Layers

Flexible perovskite solar cells (F-PSCs) exhibit broad application prospects due to their lightweight and bendable properties. However, uneven substrates and thermal–mechanical deformation during bending hinder the growth of high-quality perovskite films. Meanwhile, stress accumulation at the interfaces of flexible dev...

Lu-Xiao Sang, Yu-Jing Tang, Yun-Sheng Lin et al. · 0 citations

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