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Guo-Feng You

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#software testing Oct 2026

Parametric Laser Mapping (PLM): A Fault Isolation Solution for Analog Soft Failure

Conventional dynamic laser stimulation (DLS) relies on binary pass/fail detection and sequential single-parameter analysis, which limits sensitivity, efficiency, and robustness when applied to analog soft failures. This paper presents Parametric Laser Mapping (PLM), a boundary-free fault isolation technique that cont...

Lee-Xiang Gan, Guo-Feng You, Aldrin Rico Limos et al. · 0 citations

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