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Author

Gour C. Karmakar

2 papers indexed here

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Open access Oct 2026

Dependency-aware Interpretable Defect Detection in High-dimensional Semiconductor Production Data

Semiconductor wafer fabrication relies on multistage process monitoring to maintain yield and identify defective products before downstream processing. Modern fabrication lines generate high-dimensional sensor data from heavy monitoring where machine learning techniques have become prevalent. However, existing approa...

Sakib Shahriar Shafin, Md. Maroof Ahmed, Gour C. Karmakar et al. · 0 citations
Preprint Aug 2026

From Noise to Signal: Improving Security Log Anomaly Detection Using LLMs with Endpoint-Specific Logs

Existing approaches to anomalous behaviour log detection, such as Wazuh rely primarily on predefined detection rules, while statistical anomaly detection approaches such as OpenSearch identify deviations from previously observed behavioural patterns. Recent research has investigated LLMs for log anomaly detection becau...

Christopher Henshaw, Gour C. Karmakar · 0 citations

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