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Getahun Kibret Tadesse

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Preprint Oct 2026

Sampling Reduction for Near-Field to Far-Field Transformation of Bistatic Radar Target Measurements

Accurate bistatic radar cross-section (RCS) characterization requires near-field measurements over multiple dimensions, which, under typical near-field sampling requirements, can lead to long measurement durations for electrically large radar targets. This paper presents a near-field-to-far-field transformation based o...

Getahun Kibret Tadesse, T. Dallmann · 0 citations

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