Farina Yasmeen

A LOW-POWER AND AREA-EFFICIENT DESIGN OF A WEIGHTED PSEUDORANDOM TEST-PATTERN GENERATOR FOR A TEST-PER-SCAN BUILT-IN-SELF-TEST ARCHITECTURE

Test Pattern Generator (TPG) is an essential component in Built-In Self-Test (BIST) architectures, responsible for generating pseudorandom test patterns that can be weighted to improve fault detection efficiency while reducing the dependency on deterministic random number generators. This paper proposes a novel weighte...