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Sponsored AI AM CLAUDE, A Beginner's Guide: Learn the basics of working with AI AI AM CLAUDE, A Beginner's Guide: Learn the basics of working with AI

Author

Elliott Rill

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3 papers indexed here

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Oct 2026

Failure Analysis Methods to Localize Defects in Data Path on 3D Flash Memory Products

For 3D Flash memory products, competitiveness depends not only on die size but also on how quickly data can be programmed into and read from the memory cells. Achieving high performance requires minimizing delay throughout the entire data path— from the I/O interface, through buffers and sense amplifiers, to the memo...

Long Phi, Xiao-Chen Zhu, Elliott Rill · 0 citations
Oct 2026

Localization of Gate Oxide Defects within Pool Capacitors in NAND-type 3D Flash Memory

As NAND-type 3D Flash memory continues to scale in performance, speed, and storage density, the underlying architecture has grown significantly more complex. Global reference signals and clock networks must traverse large areas of the chip while driving numerous loads. A defect affecting even a single load can distur...

Xiao-Chen Zhu, L. Ngô, Mi-Mi Dang et al. · 0 citations
#explainable ai Oct 2026

Understanding the Root Cause of Transient Failures in NAND-Type 3D Flash Memory

NAND-type 3D Flash memory—built on vertically stacked memory cells to achieve higher storage density and enhanced performance—has become a foundational technology in modern data-storage systems and AI workloads. However, continued scaling to further increase density and improve device characteristics introduces subst...

Xiao-Chen Zhu, Elliott Rill, T.-J. Du et al. · 0 citations

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