E. Lian

Single-Shot Cm-Scale Plasmonic Nanogaps for Trace Detection of Chemical Compounds

Here, we report a rapid, single-shot interference lithography strategy for the fabrication of wafer-scale, highly ordered metallic nanogap arrays with nanoscale precision. The resulting structures exhibit uniform sub-10 nm gap features across centimeter scales, yielding dense plasmonic hotspots. To assess optical perfo...