D. Dergham

Defect engineering via post-annealing in Cu-doped ZnO thin films: Impact on optical and antibacterial performance

Copper-doped zinc oxide (ZnO:Cu) thin films were deposited by vacuum thermal evaporation then annealed at 300°C, 400°C, and 500°C in order to tailor defect states and surface-related functional properties. X-ray diffraction analysis revealed a transition from an amorphous structure in the as-deposited film to a crystal...