Diagnosis of Logic and Memory Resources in FPGAs Using Embedded Processor Based Built-In Self-Test
We present an embedded processor based approach for Built-In Self-Test (BIST) and diagnosis of pro-grammable logic and memory resources in Field Programmable Gate Arrays (FPGAs). The resources under test include the programmable logic blocks (PLBs), large random access memories (RAMs), and digital signal proces-sors (D...