SleuthBench: Benchmarking Statistical LLM Evaluation Using Tabular Hidden Signals
The Empirical Layer, a set of precomputed statistical artifacts comprising summaries, fitted feature and interaction effects, and dataset descriptions, which exposes candidate patterns for direct inspection is proposed, which raises feature-contribution accuracy from 41.9% to 68.0%.
Jing-Yu Jia, Antoine Remond-Tiedrez, Aaron Alvarez et al.
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